Kenzie Fisher, a Riverwood International Charter School senior, co-authored a paper that was published online in the Journal of Applied Physics (Vol.120, Issue 2). The paper, “Effect of top electrode material on radiation-induced degradation of ferroelectric thin film structures,” grew out of an internship in materials science at the Georgia Institute of Technology during the summers of 2014 and 2015. She did research and created ferroelectric PZT thin films and performed tests on other thin films created by the Army Research Lab. A thin film is a layer of material ranging in thickness from fractions of a nanometer to several micrometers. Thin films play an important role in the development and study of materials with new and unique properties. Because of her data-collection work, Fisher receives credit as a co-author of the paper.